We offer a range of cutting-edge laser-based ultrasound systems for Non-Destructive Testing applications ranging from laboratory research and development to industry. Our systems provide market-leading sensitivity and noise reduction. The technologies on which they are based were born of research and development grants from the National Air and Space Agency (NASA) and the National Science Foundation (NSF) and have been continually updated to meet our customer’s exacting standards.
Laser-ultrasonics are used to measure fundamental material properties such as the elastic modulus, shear modulus and Poisson ratio. Those parameters are of great importance for estimation of active stresses and life service. The laser receiver can also be used alone, without the generation laser, to listen to acoustic emission occurring when the sample is under stress.
The Tempo 1D is capable of detecting surface displacements resulting from the propagation of UHF ultrasounds, up to GHz. The system measures the spatial component normal to the surface of the target tested. It is used for characterization of micro and nano components. The system has become one of the most popular laser receiver worldwide for high frequency and ultra high frequency inspection.
The Tempo 1D is optimized to process highly speckled beams. It does not require a single speckle (reflection on mirror-like surface) like classical coherent laser ultrasonic receiver. It also includes a large, 2-inch aperture for high collection-efficiency, ensuring high sensitivity on light-scattering surfaces. The Tempo 1D exhibits high optical etendue.
The multi-component laser receiver is capable of simultaneously measuring two components of the surface displacement, the out-of-plane and the in-plane motions, using a single laser probe and a single collecting optic. The detection of the in-plane component allows efficient detection of shear waves, particularly when the direction of ultrasounds propagation is normal to the surface of inspection. The optical setup is based on the TEMPO 1D but with a customized linear array photo-detector capable of detecting both the in-plane and out-of-plane contributions of the surface displacement. The system is capable of reconstructing the complete ultrasonic field.
The system is optimized to process highly speckled beams. It does not require a single speckle (reflection on mirror-like surface) like classical coherent laser ultrasonic receiver. It also includes a large, 2-inch aperture for high collection-efficiency, ensuring high sensitivity on light-scattering surfaces.
Our multi-purpose laser receiver is suited for a wide range of acoustic and ultrasonic applications from the laboratory to the factory and available in the visible or infrared. Based on our patented multi-channel random quadrature detection technology, the system is designed for remote detection of sub-nanometer displacements. The system offers high sensitivity, requires low to no maintenance, can be fitted with a variety of laser wavelengths, and is capable of rapid scans and measurements. The Quartet was born of a research and development grant by NASA and the National Science Foundation.
Because the technology does not require control over the length of the optical path within the system, the Quartet is not subject to stability issues common to most long cavity and path-stabilized interferometers. It does not require high accuracy optical components or positioning, making it exceptionally rugged. A relatively small and versatile fiberized optical head is easily mounted to fit a variety of measurement conditions and can be set-up for a wide-range of stand-off distances. Its front lens can be easily changed or replaced if necessary.
The FERROMASTER is a compact, hand-held instrument made for easy measurement of relative magnetic permeability of materials and workpieces with µr between 1.001 and 1.999. The relative permeability is measured by touching the workpiece with the sensor tip and reading the result on the LCD display. Automatic zeroing is performed by simply pressing a button.
The Fluxmeter FL-4 is a measuring device for the determination of the magnetic flux Φ (Phi) of a magnet system or a single magnet. For the examination of a permanent magnet or magnetic system, the question is the magnet quality, and how strong the magnetization of the magnet is. The measurement of the magnetic field strength with a magnetic field measuring device is only possible at certain points and does not consider the volume of the magnet. This task is done by a fluxmeter.
In combination with the List-Magnetik Helmholtz moment coil HM-1, the magnetic flux of permanent magnets can be determined very accurately, since the entire volume of the magnet is measured independently of position. The effect of the magnet on the coil is determined in the form of an electrical voltage and converted into the flux value (or flux).
The coating thickness measurement deals with the determination of the layer thickness of coatings on surfaces. Layer thickness in the technical sense, is the material thickness of one or more coatings on a substrate. A coating may be of organic origin, such as a lacquer layer, or inorganic such as the metal layer of a galvanizing process.
List-Magnetik devices use two of the non-destructive testing (NDT) techniques, the ISO 2178 magnetic induction process, and the ISO 2360 eddy current process. The magnetic inductive method is used when the substrate itself is magnetizable (steel or iron). The eddy current method comes into play when the substrate is at least electrically conductive (other metals such as aluminum).
A 3D micro & nano fabrication systems, allowing for true 3D micro and nanostructures fabrication with feature sizes down to 100nm. The compact and flexible system allows for R&D investigations and technology implementations in the field of 3D fabrication. Simple design and construction of the system allows testing of wide range of commercially available materials for applications in the field of photonics, life sciences and biology etc. Thanks to the system’s modular design and friendly user interface, different 3D structures and patterns can be produced with atmost ease
A fully configurable, all-in-one laser diode and LED characterization system for R&D laboratories and industry. It is designed to measure and analyze all major characteristics of laser diodes and LEDs in a fast and reproducible way. It is ideal tool for data sheet generation, quality control, and failure analysis and research activities with semiconductor emitters.
A customizable tool to meet various needs required by different activities. It can measure devices from UV-LEDs to telecom laser diodes and high power emitters. Also it is designed to measure high power laser bars and stacks.
State of the art instrument for emitted light far field scanning and profiling. The scanner is a compact stand-alone module with fully integrated electronics and optomechanics. Designed to fulfill the increasing demands on light emitting component beam quality analysis and testing. The extremities of newly developed instrument include widest operating and measuring ranges in the industry. This all can be done without sacrificing speed performance; a typical measurement cycle takes only seconds making it suitable for production testing of light emitting components
Neta designs its products to offer maximum performances to our clients, whether they are industrialists or first-rate scientific laboratories. Our turnkey ASOPS imaging solutions are well adapted to the needs of plenty players with very different applications.
JAX-M1 can detect acoustic waves from 100 MHz to 1 THz by measuring the variation of the reflection coefficient of a sample by a pulse laser called probe after having excited by a laser pulse called pump. Using this time resolved spectroscopy method, we produce high resolution images based on mechanical properties.
Optofluidics’ NanoTweezer system enables reversible, high-throughput imaging and characterization of submicron particles, protein aggregates, and other nanomaterials at the flip of a switch. Optofluidics – NanoTweezer Our patented chip-based photonic resonance trapping technology, allows you to manipulate and analyze objects much smaller than traditional optical tweezers without damaging their structure.
The NanoTweezer system combines the power of our custom benchtop instrument with our patented optically resonant nanotweezer chips. A specially designed microscope mount enables direct interfacing of the chips to your existing microscopy equipment and spectroscopy systems.